Laboratory-Based Testing

At Science Park Ltd., we provide cutting-edge material characterization and measurement services tailored to research and industrial applications. Our expertise spans chemical and mechanical analysis, as well as optoelectronic device performance evaluation, ensuring precise and reliable data for innovation-driven projects.

Our Services:

  • Chemical &Mechanical Measurements – Comprehensive analysis of material properties to support R&D and industrial applications.
  • Optoelectronic Device Testing – Characterization of prototype devices, including efficiency, stability, and performance metrics.
  • Data Interpretation &Consultation – Expert analysis and guidance to optimize material and device development.
With a strong foundation in advanced materials, quantum dots, conductive polymers, and energy storage technologies, we empower our clients with high-precision measurement solutions and in-depth insights to drive scientific and technological advancements.

Materials-Based Measurements &Characterization

Structural Characterization

  • X-Ray Diffraction (XRD)

  • Raman Spectroscopy

  • Fourier Transform Infrared Spectroscopy (FTIR)

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Morphological Characterization

  • Scanning Electron Microscopy (SEM)

  • Transmission Electron Microscopy (TEM)

  • High-Resolution Transmission Electron Microscopy (HRTEM)

  • Atomic Force Microscopy (AFM)

  • Optical Microscope

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Thermal Characterization

  • Thermogravimetric Analysis (TGA)

  • Differential Scanning Calorimetry (DSC)

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Mechanical Characterization

  • Tensile Testing

  • Compression Testing

  • Stress-Strain Characteristics Curves

  • Hardness Testing

  • Bending Testing

  • Shear Testing

  • Impact testing

  • Etching, Elongation, and Macrostructure

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Electrical Characterization

  • Sheet Resistance

  • Electrical Resistivity

  • Electrical Conductivity

 

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Chemical Characterization

  • Ultraviolet-Visible Spectroscopy (UV-Vis)

  • X-ray Photoelectron Spectroscopy (XPS)

 

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Surface Area Characterization

  • Contact Angle (CA)

  • Brunauer-Emmett-Teller (BET)

  • Barrett-Joyner-Halenda (BJH)

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Topographical Characterization

  • Atomic Force Microscopy (AFM)

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Electrokinetic Characterization

  • Zetapotential Measurements

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Elemental Composition Characterization

  • Energy Dispersive X-ray Spectroscopy (EDS/EDX)

 

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Colloidal & Particle Characterization

  • Dynamic Light Scattering (DLS)

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